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NE57811 Advanced DDR memory termination power with shutdown
Product data Supersedes data of 2002 Jul 16 2003 Apr 02
Philips Semiconductors
Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
DESCRIPTION
The NE57811 is designed to provide power for termination of a Double Data Rate (DDR) SDRAM memory bus. It significantly reduces parts count, board space, and overall system cost compared to previous solutions. The NE57811 DDR termination regulator maintains an output voltage (DDR reference bus voltage) that is one-half that of the RAM supply voltage. It is capable of providing up to 3.5 A for sustained periods. Overcurrent limiting protects the NE57811 from inrush currents at start-up, and overtemperature shutdown protects the device in extreme temperature situations. The SPAK-5 (SOT756) package is thermally robust for flexibility of thermal design. Because the NE57811 is a linear regulator, no external inductors or switching FETs are necessary. Fast response to load changes reduces the need for output capacitors.
FEATURES
* Fast transient response time * Overtemperature protection * Overcurrent protection * Commercial (0 C to +70 C) temperature range * Reduced need for external components
(switching FETs, inductors, decoupling capacitors)
APPLICATIONS
* Internal divider maintains termination voltage at 1/2 memory
supply voltage
* Desktop microcomputer systems * Workstations * Servers * Game machines * Set top boxes * Embedded systems * Digital video recorders
* Reference out for other memory and control components * Shutdown pin that may be used to put the device into low power
mode
* Compatible with DDR-I (VDD = 2.5 V) or DDR-II (VDD = 1.8 V)
SDRAM systems
SIMPLIFIED SYSTEM DIAGRAM
DIMM0 DIMM1
RefOut 0.1 F
SHTDWN (optional)
Control & Address VTT MEMORY CONTROLLER
NE57811
Data 100 F TERMINATION POWER
RS 20 (typical)
RT 27 (typical)
SL01690
Figure 1. Simplified system diagram.
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
ORDERING INFORMATION
PACKAGE TYPE NUMBER NAME NE57811S SPAK-5 DESCRIPTION plastic single-ended surface mounted package; 5 leads VERSION SOT756 TEMPERATURE RANGE 0 C to +70 C
Part number marking
The package is marked with the part number under the logo. The second line indicates wafer lot number. The first four characters of the third line contain a date code. The remaining characters are manufacturing codes.
PIN CONFIGURATION
PIN DESCRIPTION
PIN 1 2 3 4 5 SYMBOL VTT VDD VSS SHTDWN RefOut DESCRIPTION Regulated terminator voltage Power supply Circuit ground (Note 1) Shutdown Reference voltage out
1 VTT
2 VDD
3 VSS
4 SHTDWN
5 RefOut
NOTE: 1. The thermal backside pad connects electrically to VSS internally and provides enhancement to thermal conductivity, but it should not be used as the primary connection to ground. Device specifications apply to use of the VSS pin as the connection to ground.
SL01691
Figure 2. Pin configuration.
MAXIMUM RATINGS
SYMBOL VDD Tamb Tstg Tj Rth(j-a) PD VDD to VSS voltage Operating ambient temperature Storage temperature Junction temperature Thermal resistance, junction to ambient Power dissipation (Note 1) PARAMETER MIN. -0.3 0 -40 - - - TYP. - - - - 16.5 - MAX. +3.6 +70 +165 160 - 3.3 UNIT V C C C C/W W
NOTE: 1. Tested on a minimum footprint on a four-layer PCB per JEDEC specification JESD51-7.
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
ELECTRICAL CHARACTERISTICS
Tamb = 0 C to +70 C, VDD = 2.5 V; ITT = -3.5 A to +3.5 A, unless otherwise specified. SYMBOL VTT VACC VDD IQ(op) IQ(SD) ITT VTT PARAMETER Output voltage Output voltage accuracy (Note 4) Supply voltage Supply current Standby quiescent current Output current ITT = 0 A Standby asserted VDD = 2.5 V VDD 3.6 V VDD = 1.6 V Load regulation ITT = 1.0 A ITT = 3.5 A CLOAD Load capacitance (Note 2) Stable operation ITT = 0 A CONDITIONS MIN. - -15 1.6 - - -3.5 -2.5 - -18 - TYP. VDD/2 - - 14 1.2 - - 6 - 100 MAX. - +15 3.6 30 1.35 +3.5 +2.5 - +18 - UNIT V mV V mA mA A A mV mV F
Reference Out RefOut IrefOut CLOAD Power Stage Ilim Tlim Current limit Temperature shutdown Temperature shutdown hysteresis 3.6 - - 4.5 +150 20 5.6 - - A C C Voltage reference out (Note 3) Reference Out current max Load capacitance Stable operation IrefOut = 0 A; source or sink -15 2.2 0.1 VDD/2 3 - +15 - - mV mA F
NOTES: 1. Limits are 100% production tested at 25C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control (SQC) methods. 2. Ceramic capacitors only. Low ESR electrolytic capacitors are not necessary. 3. RefOut voltage referenced to 1/2 VDD. 4. VACC = VTT - VDD/2.
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
TYPICAL PERFORMANCE CURVES
SL01687
SL01688
Figure 3. VTT transient response (output filter 50 F ceramic)
Figure 4. VDD-to-VTT response (output filter 50 F ceramic)
1.300
1.290 NORMAL OPERATING REGION 1.280
1.270
1.260
1.250 Volts 1.240 1.230 OUTPUT SINK 1.220 OUTPUT SOURCE 1.210 1.200 -6 -5 -4 -3 -2 -1 0 Amps 1 2 3 4 5 6
SL01684
Figure 5. Typical VTT versus output current (VDD = 2.5 V @ 25 C)
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
TECHNICAL DISCUSSION
The NE57811 supplies power to the DDR memory bus termination resistors at nominally 1/2 the voltage supplied to the memory ICs or DIMMs. DDR memory output drivers source and sink current into and out of their outputs. A typical DDR memory system is seen in Figure 1 (page 2). Each input/output pin on the bus has a series 20 resistor connected to it. The bus is terminated to the DDR terminator though a 27 to 50 resistance. The memory system will then require current from the VTT terminator bus only when the instantaneous value of the aggregate bus state are not equal amounts of 1s and 0s. When memory bus speeds are in the 200-300 MHz region, the period of any single bus state is extremely small. This permits the DDR bus termination regulator to be a linear `power Op Amp' that can source and sink current instantly to the DDR bus from the VDD supply voltage. Figure 6 models the VTT loading condition of each bus line equivalent circuit during operation and with terminating resistors. This yields the worst case current loading equation:
I O(max) +
Where:
N DDR V DD 2(R T ) R S)
NDDR is the total number of terminated control, address and data lines within the DDR memory system. (typically 192) RT is the value of the terminating resistors. RS is the value of the series resistors from the active output driver. Hence the worst-case current loading condition, where there are either all 1s or all 0s for an instant, and RT is 27 and RS is 20 , produces an instantaneous output current of either + or - 3.5 Amperes.
VDD
VDD
VDD
VDD 2 OVER CURRENT OVER TEMPERATURE
VTT
100 k
VTT RefOut 5 VSS VSS VSS 100 k VSS 3 4 SHTDWN
1
VTT
SL01692
Figure 6. VTT loading conditions.
SL01693
Figure 7. Block diagram.
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
THERMAL DESIGN
Designing the proper thermal system for the NE57811 is important to its reliable operation. The NE57811 will be operating at an average power level less than the maximum rating of the part. In a typical DDR terminator system the average power dissipation is between 0.8 and 1.5 watts. The termination power will vary as the average number of `1s' and `0s' changes during normal operation of the DDR memory. The load current will assume a new value for each bus cycle at a 266 MHz rate, and will increase and decrease as the statistical average of bus states change. The terminator heatsink must be designed to accommodate the average power as a steady state condition and be able to withstand momentary periods of increased dissipation, typically 2 - 5 seconds duration. For the typical NE57811 application, the power dissipated by the terminator can be calculated: dimension as given on the X axis. If you use a double-sided PCB with some plated-through holes to help transfer heat to the bottom side, the thermal resistance only improves by about 3 - 4 C/W. After the power is estimated, the minimum PCB area can be determined by calculating the worst case thermal resistance and referring to Figure 8 to determine the PCB area. This is done by:
R qJA(min) +
Where:
T j * T amb PD
Eqn. (2)
Tj is the maximum desired junction temperature Tamb is the highest expected local ambient temperature PD is the estimated average power The junction temperature should be kept well away from the over-temperature cutoff threshold temperature (+150 C) in normal operation. Using the above power dissipation, the highest ambient temperature and a junction temperature of +125 C, calculate the maximum thermal resistance (1.5 watts is used only as an example).
o o R th(j-a)(min) + 125 C * 70 C + 36.6 o C W 1.5W
P D + I DD(VTT)Watts
Eqn. (1)
The thermal resistance of a surface mount package is given as Rth(j-a), the thermal resistance from the junction to air. JESD51-7 specifies a 4-layer multiplayer PCB (2oz/1oz/1oz/2oz copper) that is 4 inches on each side. This is probably the best (or lowest) thermal resistance you will see in any application. Most applications cannot afford the PCB area to create this situation, but the thermal performance of a multilayer PCB will still provide a significant heatsinking effect. The actual thermal resistance will be higher than the 16.5 C/W given for the 4-layer JEDEC PCB. Figure 8 shows the thermal resistance you can expect for heatsinking PCB areas less than the JEDEC specification. The graph is for a 2 oz. single-sided PCB with a square area of the side
40.0 35.0 THERMAL RESISTANCE ( C/W) 30.0 25.0 20.0 15.0 10.0 5.0 0.0 0 20 40 60 80 100
Eqn. (3)
Looking at Figure 8, you see that this power dissipation requires a minimum PCB island area of 225 mm2 (15 mm on each side). This is the smallest area you could use at this power dissipation. Of course, increasing this area will allow the NE57811 to operate at cooler temperatures, thus enhancing its long-term reliability.
10
0.25 s 0.5 s I DD (A)
DC 1
0.1 1 2 3 VDD (V) 4 5 6 7 8 9 10
LENGTH OF SIDE OF 2 oz. COPPER AREA (mm)
SL01670
SL01678
Figure 8. PCB heatsink area versus thermal resistance.
Figure 9. Safe operating area for the NE57811.
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
APPLICATION INFORMATION
The NE57811 can be used in a variety of DDR memory configurations. Its small footprint, fast transient response and lessened need for large bulk output capacitance, makes it highly adaptable. Some of these methods of use are given below. VSS so that the output will better track any variations in the VDD voltage. For different memory sizes, the values of the recommended output filter capacitances will change. For a 256 MByte memory space, for example, approximately 100 F of ceramic surface mount chip capacitors should be evenly distributed across the physical memory layout. Depending upon the PCB noise environment, this could be 10 pieces of 10 F, 20 pieces of 5 F, and so on. It might be possible to reduce the total capacitance, provided the performance remains stable. Examine the behavior of the VTT bus carefully when the system is operating and verify that deviations in the bus voltage do not exceed the DDR specification (40 mV).
Normal operating mode (VTT = VDDR/2)
The most common implementation of a DDR terminator regulator using the NE57811 is shown in Figure 10. The NE57811 has an internal resistor divider between the VDD (pin 2) and VSS (pin 3) pins which maintains the output voltage, VTT, at VDD/2. Typically, the VDD voltage is the DDR RAM supply voltage, which can range from 1.8 V to 2.5 V. The center node of this resistor divider is the reference for the VTT output voltage and the buffered RefOut signal (pin 5). There are two components to the memory signal load: a high frequency component caused by the 266 MHz plus speed of the address, data, and control buses, and a low frequency component caused by the time-average skew of all of the bus states away from an equal number of 1s and 0s. Electrolytic and tantalum capacitor appear inductive at the high frequencies. Therefore two types of capacitors are needed for the output filtering. A very good, low ESR electrolyic capacitor of no less than 470 F should be placed next to the terminator, which should be placed as close as possible to the memory array. One half of the high frequency filter capacitors should be to VDD and the other half to
Use of the SHTDWN signal and low power mode
The NE57811 provides an optional SHTDWN pin that may be used to put the device into low power mode. When SHUTDOWN is asserted (LOW), the VTT power amplifier is turned off and the output is 3-Stated. This brings the quiescent current of the entire device to less than 800 A. If the pin is not externally connected, and internal 10 k resistor biases the control logic to VDD causing the output sections to be turned on and the NE57811 operates normally.
SHTDWN VDD 2 VDD 1 VTT (HF) +VTT
NE57811
CIN 4 SHTDWN COUT (LF) VSS 3 GND VREF RefOut 5 GND COUT (HF)
SL01694
Figure 10. Normal operating method (VTT = VDD/2)
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
TEST CIRCUITS
2 VDD CIN VIN 820 F OSCON VSS 3 (5 ea) 10 F CERAMIC LIGHT LOAD HEAVY LOAD 820 F OSCON GND
NE57811
VTT 1
R(LOAD)
SL01695
Figure 11. Load transient test (+3 A - -3 A).
VIN
0.4 V
2 VDD
NE57811
4 VIN 2.5 V SHTDWN VTT 1
VSS 3
SL01696
Figure 12. VDD to VTT transient test.
2003 Apr 02
9
Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
PACKING METHOD
The NE57811 is packed in reels, as shown in Figure 13.
GUARD BAND
TAPE REEL ASSEMBLY
TAPE DETAIL
COVER TAPE
CARRIER TAPE
BARCODE LABEL
BOX
SL01305
Figure 13. Tape and reel packing method.
2003 Apr 02
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Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
Plastic single-ended surface mounted package; 5 leads
SOT756
2003 Apr 02
11
Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
REVISION HISTORY
Rev _2 Date 20030402 Description Product data (9397 750 11216). ECN 853-2360 29724 of 28 March 2003. Supersedes data of 2002 Jul 16.
* Page 4, Electrical characteristics table:
Modifications:
- (description): from "Tamb = 25 C" to "Tamb = 0 C to +70 C" - Output voltage accuracy: add symbol "VACC"; add Note 4; change Min. value from "-10" to "-15"; change Max. value from "+10" to "+15". - Change symbol "IQ" to "IQ(op)"; change Typ. value from "20" to "14"
- Add IQ(SD) row to table. - ITT: change Condition from "VDD = 2.25 - 3.6 V" to "2.5 V VDD 3.6 V". - VTT, under condition ITT = 3.5 A: change Min. value from "-20" to "-18"; change Max. value from "+20" to "+18". - RefOut: add condition "IrefOut = 0 A; source or sink"; change Min. value from "-10" to "-15"; change Max. value from "+10" to "+15". - Change subheading row from "Protection" to "Power Stage". _1 20020716 Product data (9397 750 10151). ECN 853-2360 28625 of 16 July 2002.
2003 Apr 02
12
Philips Semiconductors
Product data
Advanced DDR memory termination power with shutdown
NE57811
Data sheet status
Level
I
Data sheet status [1]
Objective data
Product status [2] [3]
Development
Definitions
This data sheet contains data from the objective specification for product development. Philips Semiconductors reserves the right to change the specification in any manner without notice. This data sheet contains data from the preliminary specification. Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product. This data sheet contains data from the product specification. Philips Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN).
II
Preliminary data
Qualification
III
Product data
Production
[1] Please consult the most recently issued data sheet before initiating or completing a design. [2] The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com. [3] For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.
Definitions
Short-form specification -- The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition -- Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information -- Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Disclaimers
Life support -- These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes -- Philips Semiconductors reserves the right to make changes in the products--including circuits, standard cells, and/or software--described or contained herein in order to improve design and/or performance. When the product is in full production (status `Production'), relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified.
Contact information
For additional information please visit http://www.semiconductors.philips.com. Fax: +31 40 27 24825
(c) Koninklijke Philips Electronics N.V. 2003 All rights reserved. Printed in U.S.A. Date of release: 04-03
For sales offices addresses send e-mail to: sales.addresses@www.semiconductors.philips.com.
Document order number:
9397 750 11216
Philips Semiconductors
2003 Apr 02 13


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